Servicio Familia 
C-SAM for RF Power Detectors
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for RF Power Detectors
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
23 results found for RF Power Detectors/Control/RF-Microwave Microcircuits/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
TSSOP-16
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-8
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SC70-6
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
QML V
Qualified
QPDSIS-38535
Surface Mount
CFP-16
QML Q
Not qualified
QPDSIS-38535
Through Hole Mount
CDIP-20
SPACE
Not qualified
ADI Space QPL
DIE
DIE
SPACE
Not qualified
ADI Space QPL
DIE
DIE
EM
Not qualified
NOT LISTED IN QPL
Surface Mount
CFP-16
EM
Not qualified
NOT LISTED IN QPL
Surface Mount
CFP-16
Part validation activities
Cost & Activity Matrix