


C-SAM for RF Low Noise Amplifier
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for RF Low Noise Amplifier
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
19 results found for Low Noise Amplifier -LNA-/RF Amplifiers/RF-Microwave Microcircuits/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOT-89-3
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
QFN-24
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
MSOP-8
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
QFN-16
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOT-363
SPACE
Not qualified
ADI Space QPL
DIE
DIE
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
LFCSP-32
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
LFCSP-6
SPACE
Not qualified
ADI Space QPL
Surface Mount
CQLCC-12
SPACE
Not qualified
ADI Space QPL
Surface Mount
CQLCC-16
Part validation activities
Cost & Activity Matrix