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C-SAM for Phase Frequency Detector

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

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EEE Parts Results Page

C-SAM for Phase Frequency Detector

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

EEE Parts Results Page

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  • Microcircuits
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        • Phase Frequency Detector

4 results found for Phase Frequency Detector/Control/RF-Microwave Microcircuits/Microcircuits

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5962-8780301CA
ML4344/BCA
Lansdale
5962-87803

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-14

5962-87752012A
ML12540/B2A
Lansdale
5962-87752

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20

5962-8775201CA
ML12540/BCA
Lansdale
5962-87752

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-14

5962-8780301DA
ML4344/BDA
Lansdale
5962-87803

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-14
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