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doEEEt Cross Sectioning for Peripheral-Controller | doEEEt.com
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Cross Sectioning for Peripheral-Controller

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

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EEE Parts Results Page

Cross Sectioning for Peripheral-Controller

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

EEE Parts Results Page

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      • Peripheral-Controller

130 results found for Peripheral-Controller/Digital/Microcircuits

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Part reference
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Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Unit price
Lead time

86030013A
GEM14101Q3A
SRI International formerly Sarnoff
86030

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-28
DMA Address Generator

5962-8950505TA
P1753-30GMB
Pyramid Semiconductor
5962-89505

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-64 (Gull Wing)
Memory Block Protection

5962-8950502YA
P1753-30QGMB
Pyramid Semiconductor
5962-89505

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-68 (Gull Wing)
Memory Block Protection

V62/04650-01XE
TSB43AA82AIPGEEP
Texas Instruments
V62/04650

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
LQFP-144
Link Layer Controller

V62/03668-01XE
SN74LVT8980AIDWREP
Texas Instruments
V62/03668

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
SOIC-24
Test Bus Controller

5962-8864203YA
P1754-40QGMB
Pyramid Semiconductor
5962-88642

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-68 (Gull Wing)
Processor Interface

5962-8864203UA
P1754-40QLMB
Pyramid Semiconductor
5962-88642

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-68
Processor Interface

5962-8864303YA
GEM22703QYA
SRI International formerly Sarnoff
5962-88643

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-48
Microprogram Controller

5962-8757401UA
2964B/BUA
Rochester
5962-87574

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-44
Dynamic Memory Controller

5962-8864303YC
GEM22703QYC
SRI International formerly Sarnoff
5962-88643

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-48
Microprogram Controller
Part validation activities
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