


C-SAM for Other Interfaces ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Other Interfaces ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
181 results found for Other Interfaces/Communication-Interface/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
MSOP-8
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-8
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-8
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
TO-99
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
QML Q
Not qualified
QPDSIS-38535
Surface Mount
CFP-14
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
883
Qualified
QPDSIS-38535
Not Available
Not Available
QML V
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
HTQFP-100
Part validation activities
Cost & Activity Matrix