


C-SAM for Optocouplers Hybrids
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Optocouplers Hybrids
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
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268 results found for
Optocouplers Hybrids/Microcircuits
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# Part reference
Lead time
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
QML K
Qualified
QPDSIS-38534
Through Hole Mount
CDIP-8
QML E
Qualified
QPDSIS-38534
Through Hole Mount
CDIP-8
QML H
Qualified
QPDSIS-38534
Through Hole Mount
CDIP-8
QML H
Qualified
QPDSIS-38534
Through Hole Mount
CDIP-16
QML K
Qualified
QPDSIS-38534
Through Hole Mount
CDIP-16
QML K
Qualified
QPDSIS-38534
Through Hole Mount
CDIP-8
QML H
Qualified
QPDSIS-38534
Through Hole Mount
CDIP-8
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