Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt C-SAM for Optocoupler | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

C-SAM for Optocoupler

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

Frequently Asked Questions (FAQs) – Scanning Acoustic Microscopy

Microsection images.

Test combination for detecting defects in plastic ICs

Importance of SAM for delamination detection

Importance of the SAM for delamination detection

Scanning Acoustic Microscopy

CSAM Techniques for COTS Validation

EEE Parts Results Page

C-SAM for Optocoupler

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Discretes
    • Optocoupler

379 results found for Optocoupler/Discretes

Reset
Part reference
Quality level / QPL
TOP
Package
TID (krads)
Collector Current [Max]
Collector-Emitter Voltage (base open) [Max]
Forward Current Transfer Ratio
Forward Voltage [Max]
Unit price
Lead time

JANS4N22AU
4N22AU LCC-6
Micropac Industries Inc
MIL-PRF-19500/486

Compare DCL / BOM Cart
JANS
Not qualified
QPDSIS-19500
-55ºC to +125ºC
Surface Mount
LCC-6
50mA
40V
100 @Ic=10mA ; Vce=5V
1,5V

JANS4N22
4N22 TO-78
Micropac Industries Inc
MIL-PRF-19500/486

Compare DCL / BOM Cart
JANS
Qualified
QPDSIS-19500
-55ºC to +125ºC
Through Hole Mount
TO-78
50mA
40V
100 @Ic=10mA ; Vce=5V
1,5V

JANTX4N23U
4N23U LCC-6
Micropac Industries Inc
MIL-PRF-19500/486

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-55ºC to +125ºC
Surface Mount
LCC-6
50mA
40V
100 @Ic=10mA ; Vce=5V
1,5V

66177-312
66177-312 FP-10 (Gull Wing)
Micropac Industries Inc
MFR DS 66177

Compare DCL / BOM Cart
CLASS H EQ
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
FP-10 (Gull Wing)
50mA
40V
100 @Ic=10mA ; Vce=5V
1,5V

66143-002
66143-002 LCC-20
Micropac Industries Inc
MFR DS 66143

Compare DCL / BOM Cart
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
LCC-20
50mA
40V
100 @Ic=10mA ; Vce=5V
1,5V

66228-001
66228-001 TO-72
Micropac Industries Inc
MFR DS 66228

Compare DCL / BOM Cart
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Through Hole Mount
TO-72
50mA
60V
1,8V

66212-105
66212-105 LCC-4
Micropac Industries Inc
MFR DS 66212

Compare DCL / BOM Cart
JANTXV EQ
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
LCC-4
50mA
40V
1,5V

66138-318
66138-318 LCC-6
Micropac Industries Inc
MFR DS 4N47BU_48BU_49BU

Compare DCL / BOM Cart
JANS EQ
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
LCC-6
50mA
60V
100 @Ic=10mA ; Vce=5V
1,5V

66191-105
66191-105 LCC-6
Micropac Industries Inc
MFR DS 66191

Compare DCL / BOM Cart
JANTXV EQ
Not qualified
NOT LISTED IN QPL
-55ºC to +100ºC
Surface Mount
LCC-6
50mA
40V
100 @If=10mA ; Vce=1V
2V

66163-101
66163-101 TO-72
Micropac Industries Inc
MFR DS 66163

Compare DCL / BOM Cart
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Through Hole Mount
TO-72
50mA
50V
1,5V
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.