


C-SAM for Operational Amplifier
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Operational Amplifier
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
1405 results found for Operational Amplifier/Amplifier/Signal Acquisition-Conditioning/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
COMMERCIAL
Not qualified
NOT LISTED IN QPL
GOLD
Through Hole Mount
PDIP-8
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-8
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-8
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-8
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-8
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOT-23
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-8
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-8
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SO-8
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-8
Part validation activities
Cost & Activity Matrix