Servicio Familia 
C-SAM for NVRAM Memory
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for NVRAM Memory
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
6 results found for NVRAM/RAM/Memory/Digital/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Access Time [Max]
Memory Size
Unit price
Lead time
QML Q
Not qualified
QPDSIS-38535
Surface Mount
CFP-40
TID (HDR): 500.0
SEL (Let): 120.0
1 us
4M (512K x 8)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-32
35ns
256K (32K x 8)
QML Q
Not qualified
QPDSIS-38535
Surface Mount
CFP-40
TID (HDR): 500.0
SEL (Let): 120.0
1 us
4M (512K x 8)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-32
35ns
256K (32K x 8)
QML Q
Not qualified
QPDSIS-38535
Surface Mount
CFP-40
TID (HDR): 500.0
SEL (Let): 120.0
1 us
2M (256K x 8)
QML Q
Not qualified
QPDSIS-38535
Surface Mount
CFP-40
TID (HDR): 500.0
SEL (Let): 120.0
1 us
2M (256K x 8)
Part validation activities
Cost & Activity Matrix