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doEEEt Cross Sectioning for NTC Thermistors | doEEEt.com
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Cross Sectioning for NTC Thermistors

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

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EEE Parts Results Page

Cross Sectioning for NTC Thermistors

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

EEE Parts Results Page

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  • Thermistors
    • NTC

26008 results found for NTC/Thermistors

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Quality level / QPL
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Package
Resistance [Nom]
Tolerance
Unit price
Lead time

JAXA2160/A101-2012BXXXXG5493F 4410K-4600K
TCT6G 549K@25ºC 1% 4410K-4600K 0805 Chip
Tateyama Kagaku Group
JAXA-QTS-2160/A101

Compare DCL / BOM Cart
SPACE
Qualified
JAXA QPL
-25ºC to +125ºC
Surface Mount
Chip
549K
±1%

311P18-07S94R
MEAS44907S 10K@25ºC ±0,2ºC Type S 94cm
TE Connectivity MEAS -YSI-
S-311-P-18

Compare DCL / BOM Cart
NASA SCREENING LEVEL1
Qualified
GSFC-311-QPLD
-55ºC to +90ºC
Through Hole Mount
Radial bead
10K
±0,81%

JAXA2160/A101-2012BXXXXG2701H 3410K-3600K
TCT6G 2K7@25ºC 3% 3410K-3600K 0805 Chip
Tateyama Kagaku Group
JAXA-QTS-2160/A101

Compare DCL / BOM Cart
SPACE
Qualified
JAXA QPL
-25ºC to +125ºC
Surface Mount
Chip
2K7
±3%

311P18-02E17R
311P18-02E 2K252@25ºC ±0,1ºC Type E 17cm
Quality Thermistor
S-311-P-18

Compare DCL / BOM Cart
NASA SCREENING LEVEL1
Qualified
GSFC-311-QPLD
-55ºC to +70ºC
Through Hole Mount
Radial bead
2K252
±0,44%

311P18-05S14R
311P18-05S 5K@25ºC ±0,2ºC Type S 14cm
Quality Thermistor
S-311-P-18

Compare DCL / BOM Cart
NASA SCREENING LEVEL1
Qualified
GSFC-311-QPLD
-55ºC to +90ºC
Through Hole Mount
Radial bead
5K
±0,88%

JAXA2160/A101-2012BXXXXH4221F 2810K-3000K
TCT6G 4K22@25ºC 1% 2810K-3000K 0805 Chip
Tateyama Kagaku Group
JAXA-QTS-2160/A101

Compare DCL / BOM Cart
SPACE
Qualified
JAXA QPL
-25ºC to +125ºC
Surface Mount
Chip
4K22
±1%

JAXA2160/A101-2012BXXXXF8202G 3610K-3800K
TCT6G 82K@25ºC 2% 3610K-3800K 0805 Chip
Tateyama Kagaku Group
JAXA-QTS-2160/A101

Compare DCL / BOM Cart
SPACE
Qualified
JAXA QPL
-25ºC to +125ºC
Surface Mount
Chip
82K
±2%

311P18-08T26R
MEAS44908T 10K@25ºC ±0,1ºC Type T 26cm
TE Connectivity MEAS -YSI-
S-311-P-18

Compare DCL / BOM Cart
NASA SCREENING LEVEL1
Qualified
GSFC-311-QPLD
-55ºC to +70ºC
Through Hole Mount
Radial bead
10K
±0,4%

311P18-02T15R
MEAS44902T 2K252@25ºC ±0,1ºC Type T 15cm
TE Connectivity MEAS -YSI-
S-311-P-18

Compare DCL / BOM Cart
NASA SCREENING LEVEL1
Qualified
GSFC-311-QPLD
-55ºC to +70ºC
Through Hole Mount
Radial bead
2K252
±0,44%

JAXA2160/A101-2012BXXXXF4871F 3810K-4000K
TCT6G 4K87@25ºC 1% 3810K-4000K 0805 Chip
Tateyama Kagaku Group
JAXA-QTS-2160/A101

Compare DCL / BOM Cart
SPACE
Qualified
JAXA QPL
-25ºC to +125ºC
Surface Mount
Chip
4K87
±1%
Part validation activities
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