


C-SAM for Multiple Diode Arrays
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Multiple Diode Arrays
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
36 results found for Multiple Diode Arrays/Diode/Discretes
Part reference
Quality level / QPL
Package
TID (krads)
Average Output Rectified Current [Max]
Breakdown Voltage [Min]
Forward Surge Current [Max]
Forward Voltage [Max]
Time for Reverse Recovery [Max]
Unit price
Lead time
JANTX
Qualified
QPDSIS-19500
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns
JANTX
Qualified
QPDSIS-19500
Surface Mount
FP-14
300mA
60V
500mA
1V
20ns
JANTX
Qualified
QPDSIS-19500
Surface Mount
FP-10
300mA
60V
500mA
1V
20ns
JANTX
Qualified
QPDSIS-19500
Surface Mount
FP-16
300mA
75V
500mA
1V
10ns
JAN
Qualified
QPDSIS-19500
Surface Mount
FP-10
300mA
60V
500mA
1V
20ns
JANTXV
Qualified
QPDSIS-19500
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns
JANTXV
Qualified
QPDSIS-19500
Through Hole Mount
DIL-14
300mA
75V
500mA
1V
10ns
JAN
Qualified
QPDSIS-19500
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns
JAN
Qualified
QPDSIS-19500
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns
JAN
Qualified
QPDSIS-19500
Through Hole Mount
DIL-14