Servicio Familia 
C-SAM for Miscellaneous ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Miscellaneous ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
54 results found for Miscellaneous Microcircuits/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Unit price
Lead time
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
HTSSOP-20
QML E
Qualified
QPDSIS-38534
Not Available
Hybrid PKG-14
QML K
Qualified
QPDSIS-38534
Surface Mount
TO-276AA (SMD.5)
TID (HDR): 1000.0
SEL (Let): 100.0
QML K
Qualified
QPDSIS-38534
Through Hole Mount
Hybrid DIP-9
TID (HDR): 100.0
TID (LDR): 100.0
SEGR (Let): 85.0
SEL (Let): 85.0
SEU (Let): 85.0
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
QFN-23
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
QFN-23
QML E
Qualified
QPDSIS-38534
Not Available
Hybrid PKG-17
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
HTQFP-80
QML E
Qualified
QPDSIS-38534
Not Available
Hybrid PKG-14
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
TSSOP-16
Part validation activities
Cost & Activity Matrix