Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Electronic Design
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt Bond Pull Test for Microcontroller | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

Bond Pull Test for Microcontroller

Bond Pull test evaluates bond strength distributions and determines compliance with the specified bond strength requirements of the applicable procurement document. Bond Pull test is applied to the wire-to-die bond, wire-to-substrate bond, or the wire-to-package lead bond inside the package of wire-connected devices bonded by soldering, thermo-compression, ultrasonic, or related techniques. >> Read more

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

EEE Parts Results Page

Bond Pull Test for Microcontroller

Bond Pull test evaluates bond strength distributions and determines compliance with the specified bond strength requirements of the applicable procurement document. Bond Pull test is applied to the wire-to-die bond, wire-to-substrate bond, or the wire-to-package lead bond inside the package of wire-connected devices bonded by soldering, thermo-compression, ultrasonic, or related techniques. >> Read more

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Microcircuits
    • Digital
      • Processor
        • Microcontroller

393 results found for Microcontroller/Processor/Digital/Microcircuits

Reset
Part reference
Quality level / QPL
TOP
Package
TID (krads)
SEE (MeV/mg/cm2)
Clock Frequency [Max]
Number of Bits
Unit price
Lead time

5962R0252302QXA
UT80CRH196KDS-WWA
Cobham Colorado Springs
5962-02523

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-40ºC to +125ºC
Surface Mount
CQFP-68
TID (HDR): 100.0
SEL (Let): 128.0
SEU (Let): 25.0
20MHz
16-Bits

5962-0252301QXC
UT80CRH196KDS-WCC
Cobham Colorado Springs
5962-02523

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-68
SEL (Let): 128.0
SEU (Let): 25.0
20MHz
16-Bits

5962H9855201VZA
UT69R00012FCAH
Cobham Colorado Springs
5962-98552

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-132
TID (HDR): 1000.0
SEL (Let): 55.0
SEU (Let): 55.0
12MHz
32-Bits

5962F9855201QZA
UT69R00012FCAH
Cobham Colorado Springs
5962-98552

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-132
TID (HDR): 300.0
SEL (Let): 55.0
SEU (Let): 55.0
12MHz
32-Bits

5962R0252304QXA
UT80CRH196KDS-WWA
Cobham Colorado Springs
5962-02523

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-40ºC to +125ºC
Surface Mount
CQFP-68
TID (HDR): 100.0
SEL (Let): 128.0
SEU (Let): 25.0
20MHz
16-Bits

5962R9855202VXC
UT69R00016GCCH
Cobham Colorado Springs
5962-98552

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CPGA-145
TID (HDR): 100.0
SEL (Let): 55.0
SEU (Let): 55.0
16MHz
32-Bits

5962H9855202VXC
UT69R00016GCCH
Cobham Colorado Springs
5962-98552

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CPGA-145
TID (HDR): 1000.0
SEL (Let): 55.0
SEU (Let): 55.0
16MHz
32-Bits

5962-9157601MUA
QP87C52/BUA
Teledyne e2v Inc
5962-91576

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-44
12MHz
8-Bits

5962-9169701MXA
87C51RC/BQA
Teledyne e2v Inc
5962-91697

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-40
16MHz
8-Bits

5962-8768401MQA
87C51/BQA
Rochester
5962-87684

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-40
12MHz
8-Bits
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Cookie Policy
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2023 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.