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doEEEt Bond Pull Test for Microcontroller | doEEEt.com
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Bond Pull Test for Microcontroller

Bond Pull test evaluates bond strength distributions and determines compliance with the specified bond strength requirements of the applicable procurement document. Bond Pull test is applied to the wire-to-die bond, wire-to-substrate bond, or the wire-to-package lead bond inside the package of wire-connected devices bonded by soldering, thermo-compression, ultrasonic, or related techniques. >> Read more

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EEE Parts Results Page

Bond Pull Test for Microcontroller

Bond Pull test evaluates bond strength distributions and determines compliance with the specified bond strength requirements of the applicable procurement document. Bond Pull test is applied to the wire-to-die bond, wire-to-substrate bond, or the wire-to-package lead bond inside the package of wire-connected devices bonded by soldering, thermo-compression, ultrasonic, or related techniques. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Microcircuits
    • Digital
      • Processor
        • Microcontroller

403 results found for Microcontroller/Processor/Digital/Microcircuits

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Part reference
Quality level / QPL
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Package
TID (krads)
SEE (MeV/mg/cm2)
Clock Frequency [Max]
Number of Bits
Unit price
Lead time

5962-8506401MMA
80C31BH/BMA
Teledyne e2v Inc
85064

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQCC-44 (J-Lead)
12MHz
8-Bits

V62/18601-01YE
TMS320F28377DPTPEP
Texas Instruments
V62/18601

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +150ºC
Surface Mount
HLQFP-176
200MHz
32-Bits

V62/12623-01XE
MSP430G2302IPW1REP
Texas Instruments
V62/12623

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
TSSOP-14
16MHz
16-Bits

5962-8506401MQA
80C31BH/BQA
Teledyne e2v Inc
85064

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-40
12MHz
8-Bits

SAM3X8ERT-H8X-HP
SAM3X8ERT-H8X-HP
Microchip Technology Nantes formerly Atmel
MFR DS DS60001614 EM

Compare DCL / BOM Cart
HIREL RT PLASTIC
Not qualified
NOT LISTED IN QPL
-40ºC to +105ºC
Surface Mount
CQFP-144
TID (HDR): 30.0
SEL (Let): 62.0
84MHz
32-Bits

ATmegaS128-MD-HP
ATmegaS128-MD-HP
Microchip Technology Nantes formerly Atmel
MFR DS DS60001528 EM

Compare DCL / BOM Cart
HIREL RT PLASTIC
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
TQFP-64
TID (HDR): 30.0
SEL (Let): 63.0
8MHz
8-Bits

8506301ZA
MG8097/BZA
Rochester
85063

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CPGA-68
12MHz
16-Bits

M4FR5969SPHPT-MLS
M4FR5969SPHPT-MLS
Texas Instruments
MFR DS SLASEK0

Compare DCL / BOM Cart
PLASTIC MLS
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
HTQFP-48
TID (HDR): 50.0
SEL (Let): 72.0
16MHz
16-Bits

VA41630-PG196F0PBA
VA41630-PG196F0PBA
VORAGO Technologies
MFR DS VA416XX

Compare DCL / BOM Cart
HIREL RT PLASTIC
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
PBGA-196
TID (HDR): 200.0
SEL (Let): 110.0
100MHz
32-Bits

SAMRH71F20E-7GB-MQ
SAMRH71F20E-7GB-MQ
Microchip Technology Nantes formerly Atmel
MFR DS DS60001593

Compare DCL / BOM Cart
QML Q EQ
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CQFP-256
TID (HDR): 100.0
SEL (Let): 78.0
100MHz
32-Bits
Part validation activities
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