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doEEEt Cross Sectioning for Logic SCAN ICs | doEEEt.com
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Cross Sectioning for Logic SCAN ICs

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

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EEE Parts Results Page

Cross Sectioning for Logic SCAN ICs

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

EEE Parts Results Page

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  • Microcircuits
    • Digital
      • Logic
        • SCAN

41 results found for SCAN/Logic/Digital/Microcircuits

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Part reference
Quality level / QPL
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Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Number of Bits
Unit price
Lead time

5962-9460102QXA
SNJ54ABT18245AWD
Texas Instruments
5962-94601

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-56
Transceiver
18-Bits

5962-9318601M3A
SNJ54ABT8245FK
Texas Instruments
5962-93186

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-28
Transceiver
8-Bits

5962-9458601Q3A
SNJ54ABT8646FK
Texas Instruments
5962-94586

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-28
Transceiver/Register
8-Bits

5962-9172601MLA
SNJ54BCT8244AJT
Texas Instruments
5962-91726

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-24
Buffer
8-Bits

5962-9174601Q3A
SNJ54BCT8240AFK
Texas Instruments
5962-91746

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-28
Inverting Buffer
8-Bits

5962-9323901QXA
SNJ54ACT8997JT
Texas Instruments
5962-93239

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-28
4-Bits

5962-9174601QLA
SNJ54BCT8240AJT
Texas Instruments
5962-91746

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-24
Inverting Buffer
8-Bits

5962-9320701MXA
SCAN18374T/MXA
Rochester
5962-93207

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-56
D-Type Flip Flop
9-Bits

5962-9469801QXA
SNJ54ABT18646HV
Texas Instruments
5962-94698

Compare DCL / BOM Cart
QML Q
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-68
Transceiver/Register
18-Bits

5962-9467201QXA
SNJ54ABT18502HV
Texas Instruments
5962-94672

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-68
Transceiver
18-Bits
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