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C-SAM for Logic Register ICs

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

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EEE Parts Results Page

C-SAM for Logic Register ICs

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

EEE Parts Results Page

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  • Microcircuits
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877 results found for Register/Logic/Digital/Microcircuits

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Package
3-State Outputs
Type
TID (krads)
SEE (MeV/mg/cm2)
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Unit price
Lead time

5962-8943801LA
54F821/QLA
Rochester
5962-89438

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-24
With
Storage Register
10-Bits
1

5962-88607013A
SNJ54LS674FK
Texas Instruments
5962-88607

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QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-28
With
Shift Register
16-Bits
1

M38510/05704BEC
GEM37404BEC
SRI International formerly Sarnoff
MIL-M-38510/57

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JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Without
Shift Register
8-Bits
1

M38510/35002B2A
54F399/B2A
Rochester
MIL-M-38510/350

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JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Without
Storage Register
4-Bits
1

5962-8775508QKC
GEM32208QKC
SRI International formerly Sarnoff
5962-87755

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QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-24
With
Storage Register
8-Bits
1

5962-9223601MSA
P54FCT534TFSMB01
Pyramid Semiconductor
5962-92236

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QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-20

5962-9223602M2A
P54FCT534ATLMB02
Pyramid Semiconductor
5962-92236

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20

5962-9223003M3A
P54FCT825BTLMB
Pyramid Semiconductor
5962-92230

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
Surface Mount
CQLCC-28

5962-9223001M3A
P54FCT825ATLMB
Pyramid Semiconductor
5962-92230

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
Surface Mount
CQLCC-28

5962-9223003MKA
P54FCT825BTFSMB
Pyramid Semiconductor
5962-92230

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
Surface Mount
CFP-24
Part validation activities
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