


C-SAM for Logic Register ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Logic Register ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
877 results found for Register/Logic/Digital/Microcircuits
Part reference
Quality level / QPL
Package
3-State Outputs
Type
TID (krads)
SEE (MeV/mg/cm2)
Number of Bits
Number of Channels
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-24
With
Storage Register
10-Bits
1
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-28
With
Shift Register
16-Bits
1
JAN B
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
Without
Shift Register
8-Bits
1
JAN B
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
Without
Storage Register
4-Bits
1
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-24
With
Storage Register
8-Bits
1
QML M
Qualified
QPDSIS-38535
Surface Mount
CFP-20
QML M
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
QML M
Qualified
QPDSIS-38535
Surface Mount
CQLCC-28
QML M
Qualified
QPDSIS-38535
Surface Mount
CQLCC-28
QML M
Qualified
QPDSIS-38535
Surface Mount
CFP-24