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doEEEt Cross Sectioning for Logic Latch ICs | doEEEt.com
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Cross Sectioning for Logic Latch ICs

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

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EEE Parts Results Page

Cross Sectioning for Logic Latch ICs

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

EEE Parts Results Page

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  • Microcircuits
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        • Latch

767 results found for Latch/Logic/Digital/Microcircuits

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Quality level / QPL
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Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Delay Time [Max]
Number of Bits
Output Type
Unit price
Lead time

5962-87556012A
EV54ACT373LMQB
Teledyne e2v Inc
5962-87556

Compare DCL / BOM Cart
QML Q
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
D-Type
11ns
8-Bits
Non-Inverting

5962-9221704MRA
P54FCT373TCMB04
Pyramid Semiconductor
5962-92217

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
D-Type
15ns
8-Bits
Non-Inverting

5962-9223801M2A
IDT54FCT573TLB
Integrated Device Technology
5962-92238

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
D-Type
15ns
8-Bits
Non-Inverting

5962-9763801QXA
SNJ54LVTH162373WD
Texas Instruments
5962-97638

Compare DCL / BOM Cart
QML Q
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-48
D-Type with Bus Hold
7,4ns
16-Bits
Non-Inverting

5962-8764401RA
P54FCT373CMB
Pyramid Semiconductor
5962-87644

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
D-Type
15ns
8-Bits
Non-Inverting

M38510/01501BEA
5475/BEA
Rochester
MIL-M-38510/15

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JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
D-Type
44ns
4-Bits
Inverting,Non-Inverting

5962-8685601RA
CD54HCT573F3A
Texas Instruments
5962-86856

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
D-Type
40ns
8-Bits
Non-Inverting

7601201FA
SNJ54LS75W
Texas Instruments
76012

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
D-Type
35ns
4-Bits
Inverting,Non-Inverting

5962-8863901SA
QP54FCT573FMQB
Teledyne e2v Inc
5962-88639

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-20
D-Type
15ns
8-Bits
Non-Inverting

SNJ54LS375J
SNJ54LS375J
Texas Instruments
QML_SNJ54LS375_TEX_DS

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
D-Type
27ns
4-Bits
Inverting,Non-Inverting
Part validation activities
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