


C-SAM for Logic Latch ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Logic Latch ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
767 results found for Latch/Logic/Digital/Microcircuits
Part reference
Quality level / QPL
Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Delay Time [Max]
Number of Bits
Output Type
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
D-Type
15ns
8-Bits
Non-Inverting
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-20
D-Type
8,5ns
8-Bits
Non-Inverting
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-20
D-Type
55ns
8-Bits
Non-Inverting
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-20
D-Type
6,2ns
8-Bits
Non-Inverting
JAN B
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-20
D-Type
9,5ns
8-Bits
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
D-Type
15ns
8-Bits
Non-Inverting
QML V
Not qualified
QPDSIS-38535
Surface Mount
CFP-20
D-Type
175ns
8-Bits
Non-Inverting
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
D-Type
35ns
8-Bits
Non-Inverting
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-20
D-Type
14ns
8-Bits
Inverting
JAN B
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20