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C-SAM for Logic Comparator ICs

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

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EEE Parts Results Page

C-SAM for Logic Comparator ICs

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

EEE Parts Results Page

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  • Microcircuits
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      • Logic
        • Comparator

276 results found for Comparator/Logic/Digital/Microcircuits

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Quality level / QPL
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Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Number of Bits
Number of Elements
Unit price
Lead time

5962-9223408MRA
P54FCT521CTCMB08
Pyramid Semiconductor
5962-92234

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
Identity
8-Bits
1

5962-9223405M2A
P54FCT521BTLMB05
Pyramid Semiconductor
5962-92234

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Identity
8-Bits
1

MAX516AMLI/883B
MAX516AMLI/883B
Maxim
MFR DS MAX516_883B

Compare DCL / BOM Cart
883
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CQLCC-28
8-Bits
4

M38510/31101B2A
54LS85FK
Texas Instruments
MIL-M-38510/311

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Magnitude
4-Bits
1

7703702EA
CD4585BF3A
Texas Instruments
77037

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Magnitude
4-Bits
1

5962-9223408MRA
QP54FCT521CTDMQB
Teledyne e2v Inc
5962-92234

Compare DCL / BOM Cart
QML Q
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
Identity
8-Bits
1

5962-9223401M2A
P54FCT521TLMB
Pyramid Semiconductor
5962-92234

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Identity
8-Bits
1

5962-9754701QEA
SNJ54LS85J
Texas Instruments
5962-97547

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Magnitude
4-Bits
1

8415101RA
SNJ54LS682J
Texas Instruments
84151

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
Magnitude
8-Bits
1

5962-9098501MRA
54AC521DMQB
Teledyne e2v Inc
5962-90985

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
Magnitude
8-Bits
1
Part validation activities
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