Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

C-SAM for LVDS Microcircuits

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

EEE Parts Results Page

C-SAM for LVDS Microcircuits

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close

480 results found for LVDS/Communication-Interface/Microcircuits

Reset