Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt Bond Pull Test for LED | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

Bond Pull Test for LED

Bond Pull test evaluates bond strength distributions and determines compliance with the specified bond strength requirements of the applicable procurement document. Bond Pull test is applied to the wire-to-die bond, wire-to-substrate bond, or the wire-to-package lead bond inside the package of wire-connected devices bonded by soldering, thermo-compression, ultrasonic, or related techniques. >> Read more

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

X-Ray Inspection applied to DPA test

Non-destructive internal inspection of EEE parts and passive components

electrical testing

Alter Technology SAM Additional Testing Capabilities

procurement-EEE-Parts

Reasons to do an Element Evaluation Procedure of EEE Parts

EEE Parts Results Page

Bond Pull Test for LED

Bond Pull test evaluates bond strength distributions and determines compliance with the specified bond strength requirements of the applicable procurement document. Bond Pull test is applied to the wire-to-die bond, wire-to-substrate bond, or the wire-to-package lead bond inside the package of wire-connected devices bonded by soldering, thermo-compression, ultrasonic, or related techniques. >> Read more

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Discretes
    • Diode
      • LED

266 results found for LED/Diode/Discretes

Reset
Part reference
Quality level / QPL
TOP
Package
TID (krads)
Colour
Forward Voltage [Max]
Luminous Intensity [Min]
Peak Radiometric Wavelength Range
Unit price
Lead time

JANTX4N53HA
4N53HA DIL-8
Micropac Industries Inc
MIL-PRF-19500/708

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-55ºC to +100ºC
Through Hole Mount
DIL-8
Red
7V
190ucd
Not Available

JANTX1N6503
1N6503 See Spec
Micropac Industries Inc
MIL-PRF-19500/574

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-65ºC to +100ºC
Through Hole Mount
See Spec
Red
30V
500ucd
595nm to 695nm

JANTX4N54EC
4N54EC DIL-8
Micropac Industries Inc
MIL-PRF-19500/708

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-55ºC to +100ºC
Through Hole Mount
DIL-8
Red
7V
79ucd
Not Available

JANTX1N6505
1N6505 See Spec
Micropac Industries Inc
MIL-PRF-19500/574

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-65ºC to +100ºC
Through Hole Mount
See Spec
Green
30V
400ucd
525nm to 580nm

JAN4N54FC
4N54FC DIL-8
Micropac Industries Inc
MIL-PRF-19500/708

Compare DCL / BOM Cart
JAN
Not qualified
QPDSIS-19500
-55ºC to +100ºC
Through Hole Mount
DIL-8
Red
7V
106ucd
Not Available

JAN4N53CA
4N53CA DIL-8
Micropac Industries Inc
MIL-PRF-19500/708

Compare DCL / BOM Cart
JAN
Not qualified
QPDSIS-19500
-55ºC to +100ºC
Through Hole Mount
DIL-8
Red
7V
44ucd
Not Available

JANTX4N52CB
4N52CB DIL-8
Micropac Industries Inc
MIL-PRF-19500/708

Compare DCL / BOM Cart
JANTX
Not qualified
QPDSIS-19500
-55ºC to +100ºC
Through Hole Mount
DIL-8
Red
7V
44ucd
Not Available

JAN4N53IB
4N53IB DIL-8
Micropac Industries Inc
MIL-PRF-19500/708

Compare DCL / BOM Cart
JAN
Not qualified
QPDSIS-19500
-55ºC to +100ºC
Through Hole Mount
DIL-8
Red
7V
257ucd
Not Available

JAN1N6497
1N6497 See Spec
Micropac Industries Inc
MIL-PRF-19500/574

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-65ºC to +100ºC
Through Hole Mount
See Spec
Red
30V
500ucd
595nm to 695nm

JAN4N52CB
4N52CB DIL-8
Micropac Industries Inc
MIL-PRF-19500/708

Compare DCL / BOM Cart
JAN
Not qualified
QPDSIS-19500
-55ºC to +100ºC
Through Hole Mount
DIL-8
Red
7V
44ucd
Not Available
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.