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C-SAM for Image Sensor

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

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EEE Parts Results Page

C-SAM for Image Sensor

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

EEE Parts Results Page

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  • Microcircuits
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2 results found for Image Sensor/IC Sensors/Microcircuits

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NOIS1SM1000A-HHC
NOIS1SM1000A-HHC
On Semiconductor
MFR DS NOIS1SM1000 EM

Compare DCL / BOM Cart
EM
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
CQCC-84 (J-Lead)

NOIS1SM1000S-HHC
NOIS1SM1000S-HHC
On Semiconductor
MFR DS NOIS1SM1000

Compare DCL / BOM Cart
SPACE
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
CQCC-84 (J-Lead)
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