


C-SAM for HEMT Transistors
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for HEMT Transistors
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
103 results found for HEMT/FET/Transistor/Discretes
Part reference
Quality level / QPL
Package
Power Dissipation [Max]
TID (krads)
Drain Current [Max]
Drain-Source Voltage [Max]
Unit price
Lead time
JANS
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
TID (HDR): 300.0
4A
200V
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
TID (HDR): 100.0
30A
40V
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
TID (HDR): 300.0
4A
200V
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
TID (HDR): 500.0
4A
200V
PROTO
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
7,5A
200V
SPACE
Not qualified
NOT LISTED IN QPL
DIE
DIE
TID (LDR): 75.0
7,5A
200V
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
TID (HDR): 500.0
5A
100V
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4
TID (HDR): 500.0
4A
300V
JANS
Not qualified
NOT LISTED IN QPL
Surface Mount
LCC-4