Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt C-SAM for Fast Recovery Rectifier | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

C-SAM for Fast Recovery Rectifier

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

Frequently Asked Questions (FAQs) – Scanning Acoustic Microscopy

Microsection images.

Test combination for detecting defects in plastic ICs

Importance of SAM for delamination detection

Importance of the SAM for delamination detection

Scanning Acoustic Microscopy

CSAM Techniques for COTS Validation

EEE Parts Results Page

C-SAM for Fast Recovery Rectifier

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Discretes
    • Diode
      • Rectifier
        • Fast Recovery

7550 results found for Fast Recovery/Rectifier/Diode/Discretes

Reset
Part reference
Quality level / QPL
TOP
Package
TID (krads)
Average Output Rectified Current [Max]
Forward Surge Current [Max]
Forward Voltage [Max]
Time for Reverse Recovery [Max]
Working Peak Reverse Voltage [Max]
Unit price
Lead time

SDR806
SDR806 DO-203AB (DO-5)
Solid State Devices Inc
MFR DS RU0059

Compare DCL / BOM Cart
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
-55ºC to +175ºC
Point to Point Wiring
DO-203AB (DO-5)
100A
1000A
1V
60ns
200V

JAN1N5415US
1N5415US Melf E (US)
Sensitron
MIL-PRF-19500/411

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-55ºC to +100ºC
Surface Mount
Melf E (US)
3A
80A
1,5V
150ns
50V

JANTX1N6621U
1N6621U Melf A (US)
Sensitron
MIL-PRF-19500/585

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-65ºC to +150ºC
Surface Mount
Melf A (US)
1,2A
20A
1,6V
30ns
400V

JAN1N6674R
1N6674R TO-254AA
Microsemi a Microchip Company
MIL-PRF-19500/617

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-65ºC to +100ºC
Through Hole Mount
TO-254AA
15A
150A
1,55V
35ns
500V

JANTX1N3913R
1N3913R DO-203AB (DO-5)
Microsemi a Microchip Company
MIL-PRF-19500/308

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-65ºC to +150ºC
Point to Point Wiring
DO-203AB (DO-5)
30A
300A
2,75V
200ns
400V

JANTXV1N5621US
1N5621US Melf A (US)
Sensitron
MIL-PRF-19500/429

Compare DCL / BOM Cart
JANTXV
Qualified
QPDSIS-19500
-55ºC to +125ºC
Surface Mount
Melf A (US)
1A
25A
1,6V
300ns
800V

JAN1N3913A
1N3913A DO-203AB (DO-5)
Microsemi a Microchip Company
MIL-PRF-19500/308

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-65ºC to +150ºC
Point to Point Wiring
DO-203AB (DO-5)
50A
400A
2,75V
150ns
400V

JANS1N5814
1N5814 DO-203AA (DO-4)
Microsemi a Microchip Company
MIL-PRF-19500/478

Compare DCL / BOM Cart
JANS
Qualified
QPDSIS-19500
-65ºC to +100ºC
Point to Point Wiring
DO-203AA (DO-4)
20A
400A
0,95V
35ns
100V

JANTX1N3911
1N3911 DO-203AB (DO-5)
Microsemi a Microchip Company
MIL-PRF-19500/308

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-65ºC to +150ºC
Point to Point Wiring
DO-203AB (DO-5)
30A
300A
2,75V
200ns
200V

SDR710
SDR710 DO-203AB (DO-5)
Solid State Devices Inc
MFR DS RU0057

Compare DCL / BOM Cart
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
-55ºC to +175ºC
Point to Point Wiring
DO-203AB (DO-5)
70A
750A
975mV
50ns
100V
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.