Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt C-SAM for FPGA | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

C-SAM for FPGA

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

Frequently Asked Questions (FAQs) – Scanning Acoustic Microscopy

Microsection images.

Test combination for detecting defects in plastic ICs

Importance of SAM for delamination detection

Importance of the SAM for delamination detection

Scanning Acoustic Microscopy

CSAM Techniques for COTS Validation

EEE Parts Results Page

C-SAM for FPGA

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Microcircuits
    • Digital
      • Programmable Logic
        • FPGA

803 results found for FPGA/Programmable Logic/Digital/Microcircuits

Reset
Part reference
Quality level / QPL
TOP
Package
Programming Type
TID (krads)
SEE (MeV/mg/cm2)
Equivalent System Gates
Unit price
Lead time

A3PE3000-2PQG208I
A3PE3000-2PQG208I
Microsemi SoC a Microchip Company
MFR DS DS0098

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
PQFP-208
FLASH
3000000

A3PE3000-PQG208I
A3PE3000-PQG208I
Microsemi SoC a Microchip Company
MFR DS DS0098

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
PQFP-208
FLASH
3000000

A54SX72A-1PQG208I
A54SX72A-1PQG208I
Microsemi SoC a Microchip Company
MFR DS SX-A FPGAs

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
PQFP-208
ANTIFUSE
108000

A3PE3000L-1PQG208I
A3PE3000L-1PQG208I
Microsemi SoC a Microchip Company
MFR DS DS0098

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
PQFP-208
FLASH
3000000

A54SX72A-2PQG208I
A54SX72A-2PQG208I
Microsemi SoC a Microchip Company
MFR DS SX-A FPGAs

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
PQFP-208
ANTIFUSE
108000

5962R9096506VTC
197A805-21
BAE Systems
5962-90965

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQFP-84
ANTIFUSE
TID (HDR): 100.0
SEL (Let): 120.0
SEU (Let): 120.0
2000

RTPF500T-1CG1509EV
RTPF500T-1CG1509EV
Microsemi SoC a Microchip Company
MFR DS PO0145

Compare DCL / BOM Cart
QML V EQ
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CCGA-1509
FLASH
TID (HDR): 100.0
SEL (Let): 80.0
SEU (Let): 80.0
481000

RTPF500T-1CG1509MS
RTPF500T-1CG1509MS
Microsemi SoC a Microchip Company
MFR DS PO0145

Compare DCL / BOM Cart
MS
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CCGA-1509
FLASH
SEL (Let): 80.0
SEU (Let): 80.0
481000

RTPF500TLS-CB1509MS
RTPF500TLS-CB1509MS
Microsemi SoC a Microchip Company
MFR DS PO0145

Compare DCL / BOM Cart
MS
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CBGA-1509
FLASH
SEL (Let): 80.0
SEU (Let): 80.0
481000

NX1H35AS-FG625PR
NX1H35AS-FG625PR
NanoXplore
MFR DS NX1H35AS EM

Compare DCL / BOM Cart
PROTO
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
PBGA-625
SRAM
4400000
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.