


C-SAM for Data Acquisition System
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Data Acquisition System
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
47 results found for Data Acquisition System/Data Converter/Signal Acquisition-Conditioning/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
883
Not qualified
NOT LISTED IN QPL
Through Hole Mount
CDIP-28
883
Not qualified
NOT LISTED IN QPL
Through Hole Mount
CDIP-20
883
Not qualified
NOT LISTED IN QPL
Through Hole Mount
CDIP-20
883
Not qualified
NOT LISTED IN QPL
Through Hole Mount
CDIP-40
883
Not qualified
NOT LISTED IN QPL
Surface Mount
CQLCC-20
QML H
Qualified
QPDSIS-38534
Through Hole Mount
CQDIP-62
QML H
Qualified
QPDSIS-38534
Through Hole Mount
CQDIP-62
QML V
Qualified
QPDSIS-38535
Surface Mount
CQFP-68
883
Not qualified
NOT LISTED IN QPL
Through Hole Mount
CDIP-40
883
Not qualified
NOT LISTED IN QPL
Through Hole Mount
CDIP-28
Part validation activities
Cost & Activity Matrix