Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Electronic Design
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt C-SAM for DA Converters | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

C-SAM for DA Converters

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

Frequently Asked Questions (FAQs) – Scanning Acoustic Microscopy

Microsection images.

Test combination for detecting defects in plastic ICs

Importance of SAM for delamination detection

Importance of the SAM for delamination detection

Scanning Acoustic Microscopy

CSAM Techniques for COTS Validation

EEE Parts Results Page

C-SAM for DA Converters

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Microcircuits
    • Signal Acquisition-Conditioning
      • Data Converter
        • Digital to Analog Converters

402 results found for Digital to Analog Converters/Data Converter/Signal Acquisition-Conditioning/Microcircuits

Reset
Part reference
Quality level / QPL
TOP
Package
Unit price
Lead time

DAC121S101QCMK/NOPB
DAC121S101QCMK/NOPB
Texas Instruments
MFR DS SNAS265

Compare DCL / BOM Cart
AEC-Q
Qualified
AEC-Q100
GOLD
-40ºC to +125ºC
Surface Mount
SOT-23-6

MAX542AESD+
MAX542AESD+
Maxim
MFR DS MAX541/MAX542

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-55ºC to +125ºC
Surface Mount
SOIC-14

LTC1667IG#TRPBF
LTC1667IG#TRPBF
Linear Technology
MFR DS LTC1666/1667/1668

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
SSOP-28

MAX521BEWG+
MAX521BEWG+
Maxim
MFR DS MAX520/521

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
SOIC-24

DAC5675AIPHP
DAC5675AIPHP
Texas Instruments
MFR DS SBAS334

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
HTQFP-48

MAX543BMJA/883B
MAX543BMJA/883B
Maxim
MFR DS MAX543_883B

Compare DCL / BOM Cart
883
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Through Hole Mount
CDIP-8

MAX500BMLP/883B
MAX500BMLP/883B
Maxim
MFR DS MAX500_883B

Compare DCL / BOM Cart
883
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CQLCC-20

5962-1120802KXA
RHD5931-201-2S
Cobham Plainview
5962-11208

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CFP-16 (Gull Wing)

5962-8768802XC
MN3009MXC
Spectrum Microwave Inc
5962-87688

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
CDIP-16

5962-8965703LA
AD7547UQ/883B
Analog Devices
5962-89657

Compare DCL / BOM Cart
QML Q
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-24
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Cookie Policy
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2023 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.