Servicio Familia 
C-SAM for Current Source ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Current Source ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
22 results found for Current Source/Power Management/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Unit price
Lead time
QML K
Qualified
QPDSIS-38534
Surface Mount
CFP-18
TID (HDR): 100.0
TID (LDR): 15.0
QML K
Qualified
QPDSIS-38534
Surface Mount
CFP-18
PROTO
Not qualified
NOT LISTED IN QPL
Evaluation Board
Evaluation Board
TID (HDR): 0.0
PROTO
Not qualified
NOT LISTED IN QPL
Surface Mount
CFP-4
QML V
Qualified
QPDSIS-38535
DIE
DIE
TID (HDR): 50.0
TID (LDR): 50.0
SEL (Let): 86.0
QML K
Qualified
QPDSIS-38534
Surface Mount
CFP-18
TID (HDR): 100.0
TID (LDR): 15.0
PROTO
Not qualified
NOT LISTED IN QPL
Surface Mount
CFP-4
QML V
Qualified
QPDSIS-38535
DIE
DIE
TID (HDR): 100.0
TID (LDR): 50.0
SEL (Let): 86.0
TESTED DIE
Not qualified
NOT LISTED IN QPL
DIE
DIE
TID (HDR): 0.0
TESTED DIE
Not qualified
NOT LISTED IN QPL
DIE
DIE
TID (HDR): 0.0
Part validation activities
Cost & Activity Matrix