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doEEEt Bond Pull Test for Current Source ICs | doEEEt.com
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Bond Pull Test for Current Source ICs

Bond Pull test evaluates bond strength distributions and determines compliance with the specified bond strength requirements of the applicable procurement document. Bond Pull test is applied to the wire-to-die bond, wire-to-substrate bond, or the wire-to-package lead bond inside the package of wire-connected devices bonded by soldering, thermo-compression, ultrasonic, or related techniques. >> Read more

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EEE Parts Results Page

Bond Pull Test for Current Source ICs

Bond Pull test evaluates bond strength distributions and determines compliance with the specified bond strength requirements of the applicable procurement document. Bond Pull test is applied to the wire-to-die bond, wire-to-substrate bond, or the wire-to-package lead bond inside the package of wire-connected devices bonded by soldering, thermo-compression, ultrasonic, or related techniques. >> Read more

EEE Parts Results Page

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  • Microcircuits
    • Power Management
      • Current Source

22 results found for Current Source/Power Management/Microcircuits

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Part reference
Quality level / QPL
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Package
TID (krads)
SEE (MeV/mg/cm2)
Unit price
Lead time

ISL70592SEHF/PROTO
ISL70592SEHF/PROTO
Renesas Electronics formerly Intersil
MFR DS FN9335

Compare DCL / BOM Cart
PROTO
Not qualified
NOT LISTED IN QPL
+25ºC
Surface Mount
CFP-4

5962R1223201KXC
PCS5038-901-1S
Frontgrade Technologies Inc
5962-12232

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CQFP-40
TID (HDR): 100.0
TID (LDR): 15.0

5962-0923401KXC
PCS5035-201-1S
Frontgrade Technologies Inc
5962-09234

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CFP-18

5962R0923401KXC
PCS5035-901-1S
Frontgrade Technologies Inc
5962-09234

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CFP-18
TID (HDR): 100.0
TID (LDR): 15.0

5962-0923401KXA
PCS5035-201-2S
Frontgrade Technologies Inc
5962-09234

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CFP-18

ISL70592SEHEVAL1Z
ISL70592SEHEVAL1Z
Renesas Electronics formerly Intersil
MFR DS FN9335

Compare DCL / BOM Cart
PROTO
Not qualified
NOT LISTED IN QPL
+25ºC
Evaluation Board
Evaluation Board
TID (HDR): 0.0

5962R1821703V9A
ISL70592SEHVX
Renesas Electronics formerly Intersil
5962-18217

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
DIE
DIE
TID (HDR): 100.0
TID (LDR): 50.0
SEL (Let): 86.0

ISL70592SEHX/SAMPLE
ISL70592SEHX/SAMPLE
Renesas Electronics formerly Intersil
MFR DS FN9335

Compare DCL / BOM Cart
TESTED DIE
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
DIE
DIE
TID (HDR): 0.0

ISL70591SEHX/SAMPLE
ISL70591SEHX/SAMPLE
Renesas Electronics formerly Intersil
MFR DS FN9335

Compare DCL / BOM Cart
TESTED DIE
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
DIE
DIE
TID (HDR): 0.0

5962R1821703VXC
ISL70592SEHVF
Renesas Electronics formerly Intersil
5962-18217

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-4
TID (HDR): 100.0
TID (LDR): 50.0
SEL (Let): 86.0
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