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doEEEt Cross Sectioning for Crystal Oscillator | doEEEt.com
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Cross Sectioning for Crystal Oscillator

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

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EEE Parts Results Page

Cross Sectioning for Crystal Oscillator

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Crystals and Oscillators
    • Crystal Oscillator

2299036 results found for Crystal Oscillator/Crystals and Oscillators

Reset
Part reference
Quality level / QPL
TOP
Package
Supply Voltage [Max]
Type
TID (krads)
SEE (MeV/mg/cm2)
Aging
Frequency
Output waveform
Stability
Unit price
Lead time

M55310/16-B34A20M00000
XO Type I 20MHz 5V 30mA
Precision Devices Inc
MIL-PRF-55310/16

Compare DCL / BOM Cart
CLASS B
Qualified
QPL-55310
-55ºC to +125ºC
Through Hole Mount
DIL-14
(22.53 x 13.8 x 6.73) mm
5V
XO
±10ppm, 1 year
20MHz
TTL
±100ppm

M55310/26-B53A35M00000
XO Type I 35MHz 5V 40mA
Vectron a Microchip Company
MIL-PRF-55310/26

Compare DCL / BOM Cart
CLASS B
Qualified
QPL-55310
-55ºC to +125ºC
Through Hole Mount
DIL-4
(20.7 x 13.08 x 5.1) mm
5V
XO
±5ppm, 1 year
35MHz
HCMOS
±65ppm

M55310/16-B31A4M000000
XO Type I 4MHz 5V 30mA
Xsis
MIL-PRF-55310/16

Compare DCL / BOM Cart
CLASS B
Qualified
QPL-55310
-55ºC to +125ºC
Through Hole Mount
DIL-14
(22.53 x 13.8 x 6.73) mm
5V
XO
±5ppm, 1 year
4MHz
TTL
±50ppm

M55310/26-B27A1M000000
XO Type I 1MHz 5V 15mA
Frequency Management International
MIL-PRF-55310/26

Compare DCL / BOM Cart
CLASS B
Qualified
QPL-55310
-55ºC to +125ºC
Through Hole Mount
DIL-4
(20.7 x 13.08 x 5.1) mm
5V
XO
±10ppm, 1 year
1MHz
HCMOS
±100ppm

M55310/09-B11A25M00000
XO Type I 25MHz 5V 30mA
Xsis
MIL-PRF-55310/9

Compare DCL / BOM Cart
CLASS B
Qualified
QPL-55310
-55ºC to +125ºC
Through Hole Mount
TO-205AA (TO-5)
(10.41 Dia x 7.62) mm
5V
XO
±10ppm, 1 year
25MHz
TTL
±50ppm

M55310/10-B31A20M00000
XO Type I 20MHz 5V 65mA
Vectron a Microchip Company
MIL-PRF-55310/10

Compare DCL / BOM Cart
CLASS B
Not qualified
QPL-55310
-55ºC to +125ºC
Through Hole Mount
TO-233AA (TO-8)
(14.35 Dia x 8.89) mm
5V
XO
±5ppm, 1 year
20MHz
TTL
±50ppm

M55310/18-B12A12M00000
XO Type I 12MHz 12V 20mA
Corning Frequency Control
MIL-PRF-55310/18

Compare DCL / BOM Cart
CLASS B
Not qualified
QPL-55310
-55ºC to +125ºC
Through Hole Mount
DIL-14
(22.53 x 13.7 x 5.1) mm
12V
XO
±10ppm, 1 year
12MHz
CMOS
±100ppm

M55310/08-B09A30M00000
XO Type I 30MHz 5V 50mA
Xsis
MIL-PRF-55310/8

Compare DCL / BOM Cart
CLASS B
Qualified
QPL-55310
-55ºC to +125ºC
Through Hole Mount
DIL-14
(22.53 x 13.7 x 5.1) mm
5V
XO
±10ppm, 1 year
30MHz
TTL
±50ppm

M55310/25-B41A100M0000
XO Type I 100MHz -5,2V 60mA
Vectron a Microchip Company
MIL-PRF-55310/25

Compare DCL / BOM Cart
CLASS B
Not qualified
QPL-55310
-55ºC to +125ºC
Through Hole Mount
DIL-4
(20.7 x 13.08 x 5.1) mm
-5,2V
XO
±10ppm, 1 year
100MHz
ECL
±100ppm

M55310/28-B04A1M000000
XO Type I 1MHz 5V 10mA
Corning Frequency Control
MIL-PRF-55310/28

Compare DCL / BOM Cart
CLASS B
Not qualified
QPL-55310
-55ºC to +125ºC
Surface Mount
LCC-4 (J-Lead)
(9.14 x 14.22 x 4.78) mm
5V
XO
±10ppm, 1 year
1MHz
TTL
±100ppm
Part validation activities
Cost & Activity Matrix
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