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doEEEt Cross Sectioning for Counter-Divider ICs | doEEEt.com
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Cross Sectioning for Counter-Divider ICs

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

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EEE Parts Results Page

Cross Sectioning for Counter-Divider ICs

The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Microcircuits
    • Digital
      • Logic
        • Counter-Divider

1263 results found for Counter-Divider/Logic/Digital/Microcircuits

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Part reference
Quality level / QPL
TOP
Package
Count Direction
Type
TID (krads)
SEE (MeV/mg/cm2)
Delay Time [Max]
Number of Bits
Unit price
Lead time

MC100EP016AFAGMC100EP016
MC100EP016AFAGMC100EP016
On Semiconductor
MFR DS MC100EP016A/D

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +70ºC
Surface Mount
LQFP-32
Up
Binary Counter
550ps
8-Bits

SNJ54S169FK
SNJ54S169FK
Texas Instruments
QML_SNJ54S169_TEX_DS

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Up/Down
Presettable Binary Counter
4-Bits

5962-9220906MFA
P54FCT161CTFSMB06
Pyramid Semiconductor
5962-92209

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
Presettable Binary Counter
6,3ns
4-Bits

5962-8864002EA
PF54FCT161CMB02
Pyramid Semiconductor
5962-88640

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Up
Presettable Binary Counter
11,5ns
4-Bits

5962-88657012A
QP54FCT163LMQB
Teledyne e2v Inc
5962-88657

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Up
Presettable Binary Counter
11,5ns
4-Bits

5962-87590012C
GEM41001Q2C
SRI International formerly Sarnoff
5962-87590

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QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Binary Counter
2,9ns
4-Bits

5962F9656001QXC
UT54ACS169UQCH
Cobham Colorado Springs
5962-96560

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
Up/Down
Binary Counter
TID (HDR): 300.0
SEL (Let): 120.0
SEU (Let): 80.0
24ns
4-Bits

5962F9656501VEC
UT54ACTS191PVCH
Cobham Colorado Springs
5962-96565

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Up/Down
Binary Counter
TID (HDR): 300.0
SEL (Let): 120.0
SEU (Let): 80.0
22ns
4-Bits

5962-88640022A
PF54FCT161LMB02
Pyramid Semiconductor
5962-88640

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Up
Presettable Binary Counter
11,5ns
4-Bits

5962R9656402QXA
UT54ACS191E-UQAH
Cobham Colorado Springs
5962-96564

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
Up/Down
Binary Counter
TID (HDR): 100.0
SEL (Let): 120.0
SEU (Let): 108.0
15ns
4-Bits
Part validation activities
Cost & Activity Matrix
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