


C-SAM for Counter-Divider ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Counter-Divider ICs
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
1303 results found for Counter-Divider/Logic/Digital/Microcircuits
Part reference
Quality level / QPL
Package
Count Direction
Type
TID (krads)
SEE (MeV/mg/cm2)
Delay Time [Max]
Number of Bits
Unit price
Lead time
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
LQFP-32
Up
Binary Counter
550ps
8-Bits
JAN B
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
BCD Counter
4-Bits
JAN B
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
Binary Counter
25ns
4-Bits
JAN B
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
Up/Down
Binary Counter
4-Bits
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
Binary Counter
210ns
14-Bits
883
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-24
Programmable Counter/Divider
180ns
1-Bits
883
Qualified
QPDSIS-38535
Not Available
Not Available
Programmable Binary Counter
4-Bits
883
Qualified
QPDSIS-38535
Surface Mount
CFP-14
BCD Counter
4-Bits
JAN B
Qualified
QPDSIS-38535
Surface Mount
CFP-14