


C-SAM for Analog Multiplier
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Analog Multiplier
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
21 results found for Analog Multiplier/Signal Acquisition-Conditioning/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
883
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
883
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-8
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
SOIC-8
883
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-18
883
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
JAN B
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
JAN B
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
QML V
Qualified
QPDSIS-38535
Through Hole Mount
TO-100
QML H
Not qualified
QPDSIS-38534
Through Hole Mount
CDIP-14
Part validation activities
Cost & Activity Matrix