


C-SAM for ASIC
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for ASIC
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
1968 results found for ASIC/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Unit price
Lead time
QML V
Qualified
QPDSIS-38535
Surface Mount
CLGA-625
TID (LDR): 100.0
SEL (Let): 78.0
QML Q
Qualified
QPDSIS-38535
Not Available
Not Available
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQFP-352
SEL (Let): 78.0
QML V
Qualified
QPDSIS-38535
Surface Mount
CQFP-256
TID (HDR): 1000.0
QML V
Qualified
QPDSIS-38535
Surface Mount
CLGA-468
TID (HDR): 1000.0
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQFP-196
TID (HDR): 300.0
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQFP-256
TID (HDR): 300.0
QML V
Qualified
QPDSIS-38535
Surface Mount
CQFP-256
TID (HDR): 300.0
QML V
Qualified
QPDSIS-38535
Surface Mount
CQFP-352
SEL (Let): 78.0
QML V
Qualified
QPDSIS-38535
Surface Mount
CQFP-48
TID (HDR): 1000.0
Part validation activities
Cost & Activity Matrix