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2033 results found for JEDEC STANDARD

Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status

V62/04748

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Microcircuit, Linear, Quad, CMOS, Micropower Operational Amplifier, Monolithic Silicon
DLA
Detail / Drawing
- / -
Active

QML_SN54HC157_TEX_DS

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SN 54 HC157, SN74HC157, QUADRUPLE 2-LINE TO 1-LINE DATA SELECTORS MULTIPLEXERS
DLA
Detail / Drawing
01/09/2003 / -
Active

5962-87725

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Microcircuit, Digital, High-Speed CMOS, Octal D-Type Flip-Flop with Clear, Monolithic Silicon
DLA
Detail / Drawing
E / -
Active

MIL-STD-750, Method 3100

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Transistor Electrical Test Methods for semiconductor Devices Part 3: Test Method Junction temperature measurement at burn-in and life test
This purpose of this test is to verify a desired junction temperature (TJ) is achieved during burn-in and life-test environments, and is conducted on a representative...
DLA
Method
/ w/Change1
Active

V62/18601

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Microcircuit, Linear-Digital, Dual Core Microcontrollers, Monolithic Silicon
DLA
Detail / Drawing
- / -
Active

MFR DS DS00003669

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RTG4 Radiation-Tolerant FPGAs
MNFR
Detail / Drawing
B / -
Active

MFR DS DS00003669 EM

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RTG4 Radiation-Tolerant FPGAs
MNFR
Detail / Drawing
B / -
Active

V62/04676

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Microcircuit, Digital, Advanced Bipolar CMOS, 3.3-V ABT Octal Edge-Triggered D-Type Flip-Flop with 3-State Outputs, Monolithic Silicon
DLA
Detail / Drawing
C / -
Active

V62/16622

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Microcircuit, Linear, Isolated, 4 Amp, Dual Channel Gate Driver, Monolithic Silicon
DLA
Detail / Drawing
A / -
Active

V62/08610

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Microcircuit, Digital-Linear, Single Synchronous Buck Pulse Modulation (PWM) Controller, Monolithic Silicon
DLA
Detail / Drawing
A / -
Active