14814 results found for
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
This section describes detailed requirements for a DPA of commonly used quartz crystals. These requirements supplement the general requirements in section 4.
DLA
Method
/ C
Active
DLA
Detail / Drawing
A / -
Active
DLA
Detail / Drawing
C / Det.Spec.&Am.2
Active
DLA
Detail / Drawing
B / -
Active
The purpose of this test method is to subject the device under test (DUT) to high current stress conditions to determine the ability of the device chip and contacts to...
DLA
Method
6 / w/Change3
Active
MNFR
Detail / Drawing
C / -
Active
DLA
Detail / Drawing
A / -
Active
Total dose testing of the ISL70002SEH. Parts were tested at low and high dose rates under biased and unbiased conditions, to a total dose of 150krad(Si) at each dose rate
TD
/ 1
Active