MIL-STD-750 Method 2057 | doEEEt

MIL-STD-750, Method 2057

Mechanical Test Methods for Semiconductor Devices Part 2: Vibration, variable frequency (monitored)

This test method is performed for the purpose of detecting malfunctions of semiconductor devices during vibration in the specified frequency range at...

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Method

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MIL-STD-202, Method 207

Electronic and Electrical Component Parts: High Impact Shock

This test is performed for the purpose of determining the ability of various parts to withstand shock of the same severity as that produced by underwater explosions,...

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Method

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MIL-PRF-39022/1

Capacitors, Fixed, Metallized, Paper-Plastic Film, or Plastic Film Dielectric, Direct Current, (Hermetically Sealed in Metal Cases), Established Reliability, Style CHR09 (Insulated)

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Detail / Drawing

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MIL-PRF-39022/8

Capacitors, Fixed, Metallized, Paper-Plastic Film, Dialectric, Direct Current, (Hermetically Sealed in Metal Cases), Established Reliability, Style CHR12 (Uninsulated)

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Detail / Drawing

F / -

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MIL-PRF-15733/73

Filters, Radio Frequency Interference, Hermetically Sealed, Style FL55

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Detail / Drawing

B / Det.Spec.&Am.1

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MIL-PRF-15733/72

Filters, Radio Frequency Interference, Hermetically Sealed,Style FL54

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Detail / Drawing

C / Det.Spec.&Am.1

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MIL-PRF-19500/102

Semiconductor Device, Transistors, NPN, Silicon, High-Power, Types 2N1016B, 2N1016C, and 2N1016D (Validation Notice)

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Detail / Drawing

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5962-91614

Microcircuit, Hybrid, Linear, +_- 15 Volt, Dual Channel, DC_DC Converter

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Detail / Drawing

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5962-92144

Microcircuit, Hybrid, Linear, 12 Volt, Dual Channel, DC_DC Converter

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Detail / Drawing

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5962-92351

Microcircuit, Hybrid, Linear, 15 Volt, Dual Channel, DC_DC Converter

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Detail / Drawing

E / -

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