MIL-STD-750, Method 2057 Mechanical Test Methods for Semiconductor Devices Part 2: Vibration, variable frequency (monitored)
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This test method is performed for the purpose of detecting malfunctions of semiconductor devices during vibration in the specified frequency range at the specified acceleration.
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MIL-STD-750, Method 2057
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MIL-STD-750, Method 2057
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