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doEEEt Displacement Damage Test for RF Attenuator
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Displacement Damage Test for RF Attenuator

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

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EEE Parts Results Page

Displacement Damage Test for RF Attenuator

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

EEE Parts Results Page

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    • RF-Microwave Microcircuits
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        • Attenuator

14 results found for Attenuator/Control/RF-Microwave Microcircuits/Microcircuits

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HMC273AMS10GE
HMC273AMS10GE
Analog Devices
MFR DS HMC273AMS10GE

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COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
MSOP-10

MAAV-011013
MAAV-011013
MACOM Technology Solutions Inc
MFR DS MAAV-011013

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COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
QFN-16

MAATCC0007
MAATCC0007
MACOM Technology Solutions Inc
MFR DS MAATCC0007

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COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
SOIC-16

94302-11
PE94302-11
Peregrine Semiconductor
MFR DS PE94302

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SPACE
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
CQFP-28 (Gull Wing)

V62/17617-01XE
HMC470ATCPZ-EP-PT
Analog Devices
V62/17617

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EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
LFCSP-16

ADH941-000C
ADH941-000C
Analog Devices
MFR SPEC ASD0016603

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SPACE
Not qualified
ADI Space QPL
-55ºC to +85ºC
DIE
DIE

ADH424-701LH5
ADH424-701LH5
Analog Devices
MFR SPEC ASD0016614

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SPACE
Not qualified
ADI Space QPL
-40ºC to +85ºC
Surface Mount
CQLCC-12

ADH424-701G16
ADH424-701G16
Analog Devices
MFR SPEC ASD0016610

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SPACE
Not qualified
ADI Space QPL
-40ºC to +85ºC
Surface Mount
QFP-16 (Gull Wing)

V62/17606-01XE
HMC624ACPSZ-EP-RL7
Analog Devices
V62/17606

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EP
Not qualified
NOT LISTED IN QPL
-55ºC to +105ºC
Surface Mount
LFCSP-24

94302-01
PE94302-01
Peregrine Semiconductor
MFR DS PE94302 EM

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EM
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
CQFP-28 (Gull Wing)
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