- Posted by doEEEt Media Group
- On February 17, 2020
In order to evaluated the displacement damage on device induced by energetic particles in space, various device samples including optocouplers, solar cells, and bipolar ransistors are irradiated with protons, neutrons and γ-rays.
The electrical parameters were measured before and after irradiation. The degradation induced by different radiation sources is compared and analyzed.
The test plan is recommended to evaluate device displacement damage for space application.
Download or read the full report here
- High Current, High Temperature Edge-Wound Inductors - January 13, 2023
- Snap-In Supercapacitors - January 13, 2023
- Q&A Webinar – Challenges of Testing of Optoelectronics COTS for Space - January 10, 2023