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doEEEt Displacement Damage Test for Logic Comparator ICs
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Displacement Damage Test for Logic Comparator ICs

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

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EEE Parts Results Page

Displacement Damage Test for Logic Comparator ICs

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

EEE Parts Results Page

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  • Microcircuits
    • Digital
      • Logic
        • Comparator

270 results found for Comparator/Logic/Digital/Microcircuits

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Quality level / QPL
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Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Number of Bits
Number of Elements
Unit price
Lead time

5962G9653601QEC
UT54ACS85PQCH
Cobham Colorado Springs
5962-96536

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Magnitude
TID (HDR): 500.0
SEL (Let): 120.0
SEU (Let): 80.0
4-Bits
1

M38510/34701B2A
JD54F521B2A
Teledyne e2v Inc
MIL-M-38510/347

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Identity
8-Bits
1

5962-88543022A
QP54FCT521ALMQB
Teledyne e2v Inc
5962-88543

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Identity
8-Bits
1

5962-9223406MSA
QP54FCT521BTFMQB
Teledyne e2v Inc
5962-92234

Compare DCL / BOM Cart
QML Q
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-20
Identity
8-Bits
1

5962G9653601QXC
UT54ACS85UQCH
Cobham Colorado Springs
5962-96536

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
Magnitude
TID (HDR): 500.0
SEL (Let): 120.0
SEU (Let): 80.0
4-Bits
1

5962-9098501BRA
54AC521/BRA
Rochester
5962-90985

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
Magnitude
8-Bits
1

5962F9653601VEC
UT54ACS85PVCH
Cobham Colorado Springs
5962-96536

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Magnitude
TID (HDR): 300.0
SEL (Let): 120.0
SEU (Let): 80.0
4-Bits
1

M38510/31101BFA
SL54LS85/BFA
Lansdale
MIL-M-38510/311

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
Magnitude
4-Bits
1

5962G9653601QXA
UT54ACS85UQAH
Cobham Colorado Springs
5962-96536

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
Magnitude
TID (HDR): 500.0
SEL (Let): 120.0
SEU (Let): 80.0
4-Bits
1

5962-9223407MSA
P54FCT521CTFSMB07
Pyramid Semiconductor
5962-92234

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-20
Identity
8-Bits
1
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