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doEEEt Displacement Damage Test for Logic Comparator ICs
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Displacement Damage Test for Logic Comparator ICs

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

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EEE Parts Results Page

Displacement Damage Test for Logic Comparator ICs

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

EEE Parts Results Page

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276 results found for Comparator/Logic/Digital/Microcircuits

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TID (krads)
SEE (MeV/mg/cm2)
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MAX516AMRG/883B
MAX516AMRG/883B
Maxim
MFR DS MAX516_883B

Compare DCL / BOM Cart
883
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Through Hole Mount
CDIP-24
8-Bits
4

M38510/08201BFA
SL54S85/BFA
Lansdale
MIL-M-38510/82

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JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
Magnitude
4-Bits
1

5962-9223401MRA
P54FCT521TCMB
Pyramid Semiconductor
5962-92234

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QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
Identity
8-Bits
1

5962-8979301SA
QP54ACT520FMQB
Teledyne e2v Inc
5962-89793

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QML Q
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-20
Identity
8-Bits
1

5962-8671301SA
25LS2521/BSA
Rochester
5962-86713

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QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-20
Identity
8-Bits
1

5962-8671301SC
GEM12401BSC
SRI International formerly Sarnoff
5962-86713

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QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-20
Identity
8-Bits
1

5962-9759101QRA
54F521/QRA
Rochester
5962-97591

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QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
Identity
8-Bits
1

5962-9223404MRA
P54FCT521ATCMB04
Pyramid Semiconductor
5962-92234

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QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
Identity
8-Bits
1

M38510/34701B2A
54F521
Texas Instruments
MIL-M-38510/347

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JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Identity
8-Bits
1

5962-8854301SA
PF54FCT521FSMB
Pyramid Semiconductor
5962-88543

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QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-20
Identity
8-Bits
1
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