


Displacement Damage Test for EEPROM Memory
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more
EEE Parts Results Page
Displacement Damage Test for EEPROM Memory
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more
EEE Parts Results Page
1530 results found for EEPROM/ROM/Memory/Digital/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Access Time [Max]
Memory Size
Unit price
Lead time
QML H
Qualified
QPDSIS-38534
Through Hole Mount
CDIP-40
200 ns
2M (128K x 16)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-28
200 ns
64K (8K x 8)
883
Qualified
QPDSIS-38535
Surface Mount
CQLCC-32
150 ns
64K (8K x 8)
QML H
Qualified
QPDSIS-38534
Through Hole Mount
HIP-66 (With Standoffs)
120 ns
1M (32K x 32)
QML H
Qualified
QPDSIS-38534
Surface Mount
CQFP-68
90 ns
1M (32K x 32)
QML H
Qualified
QPDSIS-38534
Surface Mount
CQFP-68
120 ns
1M (32K x 32)
QML H
Qualified
QPDSIS-38534
Surface Mount
CQFP-68
150 ns
4M (128K x 32)
QML H
Qualified
QPDSIS-38534
Through Hole Mount
HIP-66 (With Standoffs)
250 ns
4M (128K x 32)
QML H
Not qualified
QPDSIS-38534
Surface Mount
CQFP-68 (Gull Wing)
200 ns
4M (128K x 32)
QML H
Qualified
QPDSIS-38534
Through Hole Mount
HIP-66 (With Standoffs)
250 ns
4M (128K x 32)
Part validation activities
Cost & Activity Matrix