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doEEEt Displacement Damage Test for Digital Arithmetic ICs
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Displacement Damage Test for Digital Arithmetic ICs

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

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EEE Parts Results Page

Displacement Damage Test for Digital Arithmetic ICs

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

EEE Parts Results Page

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  • Microcircuits
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      • Logic
        • Arithmetic

422 results found for Arithmetic/Logic/Digital/Microcircuits

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Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Delay Time [Max]
Number of Bits
Number of Elements
Unit price
Lead time

M38510/31202BFA
SL54LS283/BFA
Lansdale
MIL-M-38510/312

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
Full Adder
40ns
4-Bits
1

86077012A
54HC280/B2A
Rochester
86077

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Parity Generator and Checker
235ns
9-Bits
1

M38510/34901BAA
54F280/BAA
Rochester
MIL-M-38510/349

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-14
Parity Generator and Checker
21ns
9-Bits
1

54ACT283LMQB
54ACT283LMQB
Teledyne e2v Inc
QML_54ACT283_NSC_DS

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Full Adder
4-Bits
1

M38510/31202B2C
SL54LS283/B2C
Lansdale
MIL-M-38510/312

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Full Adder
40ns
4-Bits
1

M38510/33802BEA
JD54F182BEA
Teledyne e2v Inc
MIL-M-38510/338

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
Look-Ahead Carry Adder
35ns
4-Bits
1

5962-0150701Q2A
GEM31701Q2A
SRI International formerly Sarnoff
5962-01507

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QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Look-Ahead Carry Adder
18ns
4-Bits
1

5962-86881012A
GEM10801Q2A
SRI International formerly Sarnoff
5962-86881

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
ALU/Function Generator
57ns
4-Bits
1

5962-9220101MDA
54AC280FMQB
Teledyne e2v Inc
5962-92201

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-14
Parity Generator and Checker
17ns
9-Bits
1

M38510/01101BJA
SL54181/BJA
Lansdale
MIL-M-38510/11

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-24
ALU/Function Generator
80ns
4-Bits
1
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