


Displacement Damage Test for Data Selector-Mux ICs
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more
EEE Parts Results Page
Displacement Damage Test for Data Selector-Mux ICs
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more
EEE Parts Results Page
1000 results found for Data Selector-Mux/Logic/Digital/Microcircuits
Part reference
Quality level / QPL
Package
3-State Outputs
Type
TID (krads)
SEE (MeV/mg/cm2)
Configuration
Number of Channels
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
With
Multiplexer
2:1
4
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-16
Without
Data Selector/Multiplexer
TID (HDR): 500.0
SEL (Let): 120.0
SEU (Let): 108.0
2:1
4
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-16
Without
Data Selector/Multiplexer
TID (HDR): 100.0
SEL (Let): 120.0
SEU (Let): 108.0
4:1
2
QML Q
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
With
Multiplexer
2:1
4
QML Q
Not qualified
QPDSIS-38535
Surface Mount
CQLCC-20
Without
Data Selector/Multiplexer
2:1
4
JAN B
Qualified
QPDSIS-38535
Surface Mount
CFP-16
Without
Data Selector/Multiplexer
2:1
4
JAN B
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
Without
Data Selector/Multiplexer
2:1
4
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-16
Without
Multiplexer
2:1
4
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-16
Without
Multiplexer
2:1
4
JAN B
Qualified
QPDSIS-38535
Surface Mount
CFP-16