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doEEEt Displacement Damage Test for DRAM Memory
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Displacement Damage Test for DRAM Memory

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

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EEE Parts Results Page

Displacement Damage Test for DRAM Memory

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

EEE Parts Results Page

Applications expected requirements
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  • Microcircuits
    • Digital
      • Memory
        • RAM
          • DRAM

228 results found for DRAM/RAM/Memory/Digital/Microcircuits

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Part reference
Quality level / QPL
TOP
Package
TID (krads)
SEE (MeV/mg/cm2)
Access Time [Max]
Memory Size
Unit price
Lead time

5962-9061703MRA
SMJ44C256-10JDM
Micross Components
5962-90617

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
100 ns
1M (256K x 4)

5962-9061703MXA
SMJ44C256-10HJM
Micross Components
5962-90617

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CSOJ-20
100 ns
1M (256K x 4)

5962-9754502QXA
SMJ626162-20HKDM
Micross Components
5962-97545

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-50
20 ns
8M (512K x 16)

3DSD4G08VS8613 MS
3DSD4G08VS8613 MS
3D Plus
MFR DS 3DPA-5020

Compare DCL / BOM Cart
SPACE
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
SOP-58
TID (HDR): 50.0
SEL (Let): 80.0
SEU (Let): 7.0
7ns
4G (512M x 8)

5962-8949704MMA
MT42C4256CZ-10/883C
Micross Components
5962-89497

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
ZIP-28
30 ns
1M (256K x 4)

5962-9062203MVA
MT4C1004JCN-8
Micross Components
5962-90622

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-18
80 ns
4M (4M x 1)

5962-9754503QXA
SMJ626162-12HKDM
Micross Components
5962-97545

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-50
12 ns
8M (512K x 16)

48SD6404RPFI
48SD6404RPFI
DDC formerly Maxwell Microelectronics
MFR DS 48SD6404 EM

Compare DCL / BOM Cart
EM (3 Temp)
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CFP-72
6 ns
256M (16M x 4 x 4)

97SD3240RPQI
97SD3240RPQI
DDC formerly Maxwell Microelectronics
MFR DS 97SD3240 EM

Compare DCL / BOM Cart
EM (3 Temp)
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CQFP-132
6 ns
1G (8M x 32 x 4)

97SD3248RPQI
97SD3248RPQI
DDC formerly Maxwell Microelectronics
MFR DS 97SD3248 EM

Compare DCL / BOM Cart
EM (3 Temp)
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CQFP-132
6 ns
1G (8M x 32 x 4)
Part validation activities
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