


Displacement Damage Test for DRAM Memory
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more
EEE Parts Results Page
Displacement Damage Test for DRAM Memory
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more
EEE Parts Results Page
228 results found for DRAM/RAM/Memory/Digital/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Access Time [Max]
Memory Size
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-20
100 ns
1M (256K x 4)
QML Q
Qualified
QPDSIS-38535
Surface Mount
CSOJ-20
100 ns
1M (256K x 4)
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-50
20 ns
8M (512K x 16)
SPACE
Not qualified
NOT LISTED IN QPL
Surface Mount
SOP-58
TID (HDR): 50.0
SEL (Let): 80.0
SEU (Let): 7.0
7ns
4G (512M x 8)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
ZIP-28
30 ns
1M (256K x 4)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-18
80 ns
4M (4M x 1)
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-50
12 ns
8M (512K x 16)
EM (3 Temp)
Not qualified
NOT LISTED IN QPL
Surface Mount
CFP-72
6 ns
256M (16M x 4 x 4)
EM (3 Temp)
Not qualified
NOT LISTED IN QPL
Surface Mount
CQFP-132
6 ns
1G (8M x 32 x 4)
EM (3 Temp)
Not qualified
NOT LISTED IN QPL
Surface Mount
CQFP-132
6 ns
1G (8M x 32 x 4)
Part validation activities
Cost & Activity Matrix