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doEEEt Displacement Damage Test for Current Source ICs
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Displacement Damage Test for Current Source ICs

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

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EEE Parts Results Page

Displacement Damage Test for Current Source ICs

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

EEE Parts Results Page

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  • Microcircuits
    • Power Management
      • Current Source

22 results found for Current Source/Power Management/Microcircuits

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Package
TID (krads)
SEE (MeV/mg/cm2)
Unit price
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5962-0923401KXA
PCS5035-201-2S
Frontgrade Technologies Inc
5962-09234

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CFP-18

ISL70592SEHEVAL1Z
ISL70592SEHEVAL1Z
Renesas Electronics formerly Intersil
MFR DS FN9335

Compare DCL / BOM Cart
PROTO
Not qualified
NOT LISTED IN QPL
+25ºC
Evaluation Board
Evaluation Board
TID (HDR): 0.0

5962R1821703V9A
ISL70592SEHVX
Renesas Electronics formerly Intersil
5962-18217

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
DIE
DIE
TID (HDR): 100.0
TID (LDR): 50.0
SEL (Let): 86.0

ISL70592SEHX/SAMPLE
ISL70592SEHX/SAMPLE
Renesas Electronics formerly Intersil
MFR DS FN9335

Compare DCL / BOM Cart
TESTED DIE
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
DIE
DIE
TID (HDR): 0.0

ISL70591SEHX/SAMPLE
ISL70591SEHX/SAMPLE
Renesas Electronics formerly Intersil
MFR DS FN9335

Compare DCL / BOM Cart
TESTED DIE
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
DIE
DIE
TID (HDR): 0.0

ISL73591SEHF/PROTO
ISL73591SEHF/PROTO
Renesas Electronics formerly Intersil
MFR DS FN9335

Compare DCL / BOM Cart
PROTO
Not qualified
NOT LISTED IN QPL
+25ºC
Surface Mount
CFP-4

5962L1821704V9A
ISL73592SEHVX
Renesas Electronics formerly Intersil
5962-18217

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
DIE
DIE
TID (HDR): 50.0
TID (LDR): 50.0
SEL (Let): 86.0

5962R1223201KXC
PCS5038-901-1S
Frontgrade Technologies Inc
5962-12232

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CQFP-40
TID (HDR): 100.0
TID (LDR): 15.0

5962-0923401KXC
PCS5035-201-1S
Frontgrade Technologies Inc
5962-09234

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CFP-18

ISL70592SEHF/PROTO
ISL70592SEHF/PROTO
Renesas Electronics formerly Intersil
MFR DS FN9335

Compare DCL / BOM Cart
PROTO
Not qualified
NOT LISTED IN QPL
+25ºC
Surface Mount
CFP-4
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