


Displacement Damage Test for Current Sense Amplifier
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more
EEE Parts Results Page
Displacement Damage Test for Current Sense Amplifier
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more
EEE Parts Results Page
55 results found for Current Sense-Shunt/Amplifier/Signal Acquisition-Conditioning/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
AEC-Q
Qualified
AEC-Q100
GOLD
Surface Mount
SOT-23-5
QML K
Not qualified
QPDSIS-38534
Surface Mount
CFP-10
PROTO
Not qualified
NOT LISTED IN QPL
Surface Mount
CFP-10
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-8
QML H
Not qualified
QPDSIS-38534
Surface Mount
CFP-10 (Gull Wing)
QML V
Qualified
QPDSIS-38535
Surface Mount
CFP-10
PROTO
Not qualified
NOT LISTED IN QPL
Evaluation Board
Evaluation Board
QML V
Qualified
QPDSIS-38535
Surface Mount
CFP-10
QML K
Not qualified
QPDSIS-38534
Surface Mount
CFP-16
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
SOT-23
Part validation activities
Cost & Activity Matrix