Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt Displacement Damage Test for Clock Buffer-Driver
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

Displacement Damage Test for Clock Buffer-Driver

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

Radiation Sensittive Technologies

Radiation Sensitive Technologies and EEE Parts

Working on the developing of a European standard for DD testing

Working on the developing of a European standard for DD testing

Displacement Damage Test for Space Application

Experimental Study of Displacement Damage Test for Space Application

EEE Parts Results Page

Displacement Damage Test for Clock Buffer-Driver

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Microcircuits
    • Clock and Timing
      • Clock Buffer-Driver

99 results found for Clock Buffer-Driver/Clock and Timing/Microcircuits

Reset
Part reference
Quality level / QPL
TOP
Package
Type
TID (krads)
SEE (MeV/mg/cm2)
Ratio - Input:Output
Unit price
Lead time

MC100EP11DTG
MC100EP11DTG
On Semiconductor
MFR DS MC10EP11/D

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
TSSOP-8
Fanout Buffer
1:2

CDCVF111FN
CDCVF111FN
Texas Instruments
MFR DS SCAS670

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
PQCC-28 (J-Lead)
Driver
1:9

NB4L6254FAR2G
NB4L6254FAR2G
On Semiconductor
MFR DS NB4L6254/D

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
LQFP-32
Fanout Buffer
1:6

CDCVF2310PW
CDCVF2310PW
Texas Instruments
MFR DS SCAS666

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
TSSOP-24
Buffer
1:10

MC100EP210SFAG
MC100EP210SFAG
On Semiconductor
MFR DS MC100EP210S/D

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
LQFP-32
Driver
1:5

5962-9576103Q2C
GEM36303Q2C
SRI International formerly Sarnoff
5962-95761

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Fanout Buffer
2:10

5962-9576102M2A
P49FCT805CTLMB
Pyramid Semiconductor
5962-95761

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
Fanout Buffer
2:10

5962-9576102MSA
P49FCT805CTFSMB
Pyramid Semiconductor
5962-95761

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-20
Fanout Buffer
2:10

5962-9576101MRA
P49FCT805BTCMB
Pyramid Semiconductor
5962-95761

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
Fanout Buffer
2:10

5962-9576102MRA
P49FCT805CTCMB
Pyramid Semiconductor
5962-95761

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-20
Fanout Buffer
2:10
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.