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doEEEt Displacement Damage Test for Analog Switch
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Displacement Damage Test for Analog Switch

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

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EEE Parts Results Page

Displacement Damage Test for Analog Switch

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

EEE Parts Results Page

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  • Microcircuits
    • Signal Acquisition-Conditioning
      • Analog Switch

343 results found for Analog Switch/Signal Acquisition-Conditioning/Microcircuits

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HS1-303RH/PROTO
HS1-303RH/PROTO
Renesas Electronics formerly Intersil
MFR DS FN9046

Compare DCL / BOM Cart
PROTO
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Through Hole Mount
CDIP-14

5962-9073101MEA
DG411AK/883
Vishay Siliconix
5962-90731

Compare DCL / BOM Cart
QML M
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16

5962-9204102M2A
DG442AZ/883
Vishay Siliconix
5962-92041

Compare DCL / BOM Cart
QML Q
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20

M38510/11608BCC
SJM307BCC
Vishay Siliconix
MIL-M-38510/116

Compare DCL / BOM Cart
JAN B
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-14

MAX303MJE/883B
MAX303MJE/883B
Maxim
MFR DS MAX303_883B

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883
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Through Hole Mount
CDIP-16

81006222A
HI4-5051/883
Renesas Electronics formerly Intersil
81006

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883
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20

5962R9961801TEC
HS1-201HSRH-T
Renesas Electronics formerly Intersil
5962-99618

Compare DCL / BOM Cart
QML T
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16

5962R9581204VCC
HS1-302EH-Q
Renesas Electronics formerly Intersil
5962-95812

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QML V
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-14

5962R9581301VCC
HS1-303RH-Q
Renesas Electronics formerly Intersil
5962-95813

Compare DCL / BOM Cart
QML V
Not qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-14

V62/18618-01XE
ADG1436TRUZ-EP
Analog Devices
V62/18618

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
TSSOP-16
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