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doEEEt Displacement Damage Test for Analog Multiplier
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Displacement Damage Test for Analog Multiplier

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

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EEE Parts Results Page

Displacement Damage Test for Analog Multiplier

Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more

EEE Parts Results Page

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  • Microcircuits
    • Signal Acquisition-Conditioning
      • Analog Multiplier

21 results found for Analog Multiplier/Signal Acquisition-Conditioning/Microcircuits

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5962-9053701VIA
AD534TH/QMLV
Analog Devices
5962-90537

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
TO-100

AD632SH/883B
AD632SH/883B
Analog Devices
QML_AD632_AND_DS

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883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
TO-100

M38510/13902BIA
AD534SH
Analog Devices
MIL-M-38510/139

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
TO-100

AD534SE/883B
AD534SE/883B
Analog Devices
QML_AD534_AND_DS

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883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20

M38510/13901BIA
AD534TH
Analog Devices
MIL-M-38510/139

Compare DCL / BOM Cart
JAN B
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
TO-100

5962-0520301HCA
AS1648C014
Micross Components
5962-05202

Compare DCL / BOM Cart
QML H
Not qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
CDIP-14

AD632TD/883B
AD632TD/883B
Analog Devices
QML_AD632_AND_DS

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-14

5962-9053701VCA
AD534TD/QMLV
Analog Devices
5962-90537

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-14

5962-0520201HCA
AS1595C014
Micross Components
5962-05202

Compare DCL / BOM Cart
QML H
Not qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
CDIP-14

AD632TH/883B
AD632TH/883B
Analog Devices
QML_AD632_AND_DS

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
TO-100
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