


Displacement Damage Test for AD Converters
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more
EEE Parts Results Page
Displacement Damage Test for AD Converters
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more
EEE Parts Results Page
469 results found for Analog to Digital Converters/Data Converter/Signal Acquisition-Conditioning/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
COMMERCIAL
Not qualified
NOT LISTED IN QPL
GOLD
Surface Mount
TSSOP-16
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
LFCSP-32
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
LQFP-44
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
LFCSP-10
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
LQFP-48
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
QFN-38
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
SOIC-16
QML N
Qualified
QPDSIS-38535
Surface Mount
TSSOP-32
QML H
Qualified
QPDSIS-38534
Through Hole Mount
CDIP-18
883
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-28
Part validation activities
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